Attend a lunchtime tutorial with LatticeGear and TESCAN USA at M&M 2015
July 23, 2015
Join us on Wednesday, August 5, from 12:00 - 1:00pm, to attend a Lunch and Learn tutorial offered by TESCAN USA, booth 873. Learn more about the sample preparation workflow for SEM, FIB and Plasma FIB users. See how the LatticeAx 420 delivers repeatable, high accuracy cleaving (HAC), even for small, irregular-shaped, and single, multi- and non-crystalline material samples, and provides an indispensable resource for quickly accessing the target and reducing the time to analysis-ready samples.
Contact us to request your invitation, or visit the TESCAN booth during M&M to secure your spot.